Electrical performances of AlInN/GaN HEMTs. A comparison with AlGaN/GaN HEMTs with similar technological process

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ELECTRICAL CHARACTERIZATION OF AlGaN/GaN HEMTs ON Si SUBSTRATE

Deep traps in AlGaN/GaN high electron mobility transistors on silicon substrate were characterized by the means of current-voltage and Deep Level Transient Spectroscopy (DLTS). DLTS measurements have revealed only hole-trap with an activation energy of 0.82eV. The nature and the localization of this trap are discussed here.

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atedA GaN/GaN HEMTs

Two simple class-F NVI1VIIC power amplifiers are described using 0.7tm field-plated GaN HEMT devices. One circuit was designed for operation at 2.0 GHz and achieved a power-added-efficiency of 50%, 38 dBm output power, and 6.2 W/mm power density. A second circuit was designed at 2.8 GHz and achieved a PAE of 46% with 37 dBm output power and 7.0 W/mm power density.

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ژورنال

عنوان ژورنال: International Journal of Microwave and Wireless Technologies

سال: 2011

ISSN: 1759-0787,1759-0795

DOI: 10.1017/s1759078711000419